How Sequential Depth helps to Improve Test coverage ?

SCAN, Boundary SCAN, MBIST, ATPG, JTAG, ATE, DFT simulations.
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vikramrajput
Posts: 21
Joined: Mon Apr 06, 2015 9:30 pm

How Sequential Depth helps to Improve Test coverage ?

Post by vikramrajput » Tue Nov 17, 2015 10:03 pm

Hi,

suppose we have a FF1 which is scannable with scan clock and its output is connected to FF2 which is non scannable. I mean FF1 is connected with scan clock and FF2 is connected with normal clock. If we increase sequential depth , then how it will increase or effect test coverage ?

RENU
Posts: 22
Joined: Mon Apr 07, 2014 11:18 pm

Re: How Sequential Depth helps to Improve Test coverage ?

Post by RENU » Fri Dec 11, 2015 4:52 pm

Hi Vikram,

May be you know as sequential depth is related to capture ( Launc on capture if atspeed), when we want to capture value related to input of non-scannable flop we need extra clock pulse so by increasing seuential depth as 2 you can capture response of that non-scan flop via scanable flop hence test coverage will improve.

Thanks & Regards,
Renu

vikramrajput
Posts: 21
Joined: Mon Apr 06, 2015 9:30 pm

Re: How Sequential Depth helps to Improve Test coverage ?

Post by vikramrajput » Fri Apr 08, 2016 11:04 pm

hi renu,

can you please elaborate your answer. and also let me know, this functionality is related to NCP (Named Captured Procedure) cycles ?

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