How Sequential Depth helps to Improve Test coverage ?
Posted: Tue Nov 17, 2015 10:03 pm
Hi,
suppose we have a FF1 which is scannable with scan clock and its output is connected to FF2 which is non scannable. I mean FF1 is connected with scan clock and FF2 is connected with normal clock. If we increase sequential depth , then how it will increase or effect test coverage ?
suppose we have a FF1 which is scannable with scan clock and its output is connected to FF2 which is non scannable. I mean FF1 is connected with scan clock and FF2 is connected with normal clock. If we increase sequential depth , then how it will increase or effect test coverage ?